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        Blemish Checker for FPD NM Series

        High-speed, high-precision detection and measurement of coating unevenness in liquid crystal panel color filters

        Unevenness camera&lighting

        Unevenness transmission and reflection isolation

        Unevenness device structure

        Unevenness inspection results


        Detecting failures and uneven points on color resist film coated by Toray’s Coater.
        Toray’s customized algorithm achieved fast throughput and high resolution.

        • High performance of detection specialized in the Mura of Toray’s coater.
        • High reliability of system. (movable part is only conveyer)
        • Fast checking speed on a par of coating speed of Toray’s Coater.


        • Improve the yield of production of Color Filter Panel
        • Cut down start losses
        • Prevent the outflow of inferior panels

        NM specifications

        Model NM610
        Substrate Size Can support up to G10 substrate depending on the number of cameras
        Application Pattern resin BM, R, G, B, OC, PS (CS)
        Transparent film pre-patterning substrates
        Cheking System Monochromatic CCD camera + LCD light source
        Detectable MURA Mura arising from Toray'’s coater
        (V-Line, H-Line, V-Mura, H-Mura, White-Pin, White-Boke, Other)
        Tackt-time (Reference) 35 sec/G8 (including substrate switch-out time)
        Checking Speed 300mm/sec
        Outer Dimension 6000(W) × 3200(D) × 2500(H)/G8
        Weight Approx. 5,000 kg
        Utilities AC 220 V ± 10 %, Pressure Air, Exhaust
        • Related terms
          • Coating unevenness
          • Unevenness inspection
          • Linear unevenness
          • Pin unevenness


        Technological Field
        Technology >> Image processing > FPD-related Inspection Equipment

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