<tbody id="ddimn"></tbody>
    <rp id="ddimn"></rp>

    <em id="ddimn"></em>
  1. <em id="ddimn"><acronym id="ddimn"><input id="ddimn"></input></acronym></em>
  2. <em id="ddimn"></em>
    1. <em id="ddimn"><strike id="ddimn"><u id="ddimn"></u></strike></em>
      <ol id="ddimn"></ol>

        <tbody id="ddimn"><p id="ddimn"></p></tbody>

        <button id="ddimn"></button>

      1. <button id="ddimn"><acronym id="ddimn"></acronym></button>

        HS-830 Foreign Matter Inspection Device for FPDs

        This product has been discontinued.

        High-speed inspection for contaminants on glass substrate with sub-micron sensitivity

        Contaminant inspection equipment

        Overview

        Like the HS-730, the first inspection device in the industry to offer sub-micron sensitivity, the HS-830 is infused with all the top-notch optical technology that we at Toray Engineering have to offer. This device enables you to detect foreign matter on glass substrate in a quarter of the time it used to take.

        Features

        • Allows swift, high-sensitivity inspections,e.g., 86 seconds when inspecting 1100mm x 1300mm substrate.
        • New inspection system combines traditional laser scattering methods with image detection opticals to achieve a high level of inspection reliability and spatial resolution.
        • High spatial resolution and review capability:
          high degree of foreign matter position detection precision enables review with high-magnification microscope possible—impossible with older types of inspection devices.
        • High-magnification review function (total magnification up to 2000 times when converted for 14-inch monitor) included as standard feature.

        Optional function

        • Loader/Unloader
        • AGV/MVG
        • CIM
        • Front/back simultaneous inspection function
        • Contaminant map comparison function

        Principles of HS detection

        Principles of HS detection

        Principles of HS detection

        Principles of HS detection

        HS specifications

        Model HS-830
        Detection method Laser scattering imaging
        Detection data Number and position of foreign objects on glass, chrome or ITO substrate; SML class; foreign matter map and histogram
        Allowable substrate size
        &
        actual inspection time
        (in high-speed inspection mode)
        400mm × 500mm : 24sec
        600mm × 720mm : 41sec
        730mm × 920mm : 55sec
        1100mm × 1300mm : 86sec
        1500mm × 1850mm : 144sec
        2200mm × 2250mm : 277sec
        2950mm × 3130mm : 317sec
        Inspection sensitivity 0.3 μm (standard particle scattering substrate)
        Spatial resolution 30μm
        Front/back separation capacity 20μm(t=1.1mm)
        16μm(t=0.7mm)
        Review function Standard feature
        • Related terms
          • Contaminant inspection
          • Detritus inspection
          • Particle
          • Front/back separation
          • High-speed inspection
          • Sub-micron sensitivity

        Inquiries

        Technological Field
        Technology >> Image processing > FPD-related Inspection Equipment

        earn jetblue points on american airlines,earn nursing degree online,play to earn games crypto,4cus earn money